Stony Brook University The Graduate School

X-ray Diffraction Microscopy (XDM) has been gaining in popularity for nanoscale imaging of biological and material science samples. Its high penetration depth (compared to electron microscopy) and its good dose efficiency (compared to its lens-based X-ray alternative) make it uniquely suited for imaging whole biological specimens, where radiation damage is a concern. Despite these advantages, XDM is still far from being a routine imaging tool. This is due to the computational challenge of reconstructing an image from recorded diffraction intensities as well as difficult-to-satisfy experimental requirements.